Study on PCB defect detection based on improved YOLOv11

Study on PCB defect detection based on improved YOLOv11

WANG Meng, LI Fei, ZHAN Shaosheng

Journal of Qilu University of Technology ›› 2026, Vol. 40 ›› Issue (3) : 74-80.

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Journal of Qilu University of Technology ›› 2026, Vol. 40 ›› Issue (3) : 74-80. DOI: 10.16442/j.cnki.qlgydxxb.2026.03.009

Mechatronics engineering and information engineering

Study on PCB defect detection based on improved YOLOv11

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 40(3): 74-80 https://doi.org/10.16442/j.cnki.qlgydxxb.2026.03.009

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